Measuring Volterra kernels of analog to digital converters using a stepped three-tone scan
2006 (English)In: 2006 IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE PROCEEDINGS, 2006, 1047-1050 p.Conference paper (Other academic)
Volterra theory can be used to mathematically model nonlinear dynamic components such as analog-to-digital converter (ADC). This paper describes how frequency domain Volterra kernels of an ADC are determined from measurements. The elements of Volterra theory are given and practical issues are considered, such as methods for signal conditioning, finding the appropriate test signals scenario and suitable sampling frequency. The results show that for the used pipeline ADC, the frequency dependence is significantly stronger for second order difference products than for sum products and the linear frequency dependence was not as pronounced as that of the second order Volterra kernel.
Place, publisher, year, edition, pages
2006. 1047-1050 p.
, IEEE Instrumentation and Measurement Technology Conference, ISSN 1091-5281
analog to digital converters, ADC, Volterra kernels, test, measurements
Electrical Engineering, Electronic Engineering, Information Engineering
IdentifiersURN: urn:nbn:se:kth:diva-34933DOI: 10.1109/IMTC.2006.234872ISI: 000244176702019ScopusID: 2-s2.0-34648858872ISBN: 978-0-7803-9359-2OAI: oai:DiVA.org:kth-34933DiVA: diva2:428684
23rd IEEE Instrumentation and Measurement Technology Conference Sorrento, ITALY, APR 24-27, 2006
QC 201107012011-07-012011-06-172011-11-08Bibliographically approved