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Post-correction of under-sampled analog to digital converters
KTH, School of Electrical Engineering (EES), Signal Processing. KTH, School of Electrical Engineering (EES), Centres, ACCESS Linnaeus Centre.ORCID iD: 0000-0002-2718-0262
2007 (English)In: 2007 IEEE INSTRUMENTATION & MEASUREMENT TECHNOLOGY CONFERENCE, 2007, 58-62 p.Conference paper, Published paper (Refereed)
Abstract [en]

Applications with wide bandwidth and high center frequencies force the analog to digital converter (ADC) to be active in a working range with less dynamic performance in relation to lower frequency bands. However using under-sampling techniques in combination with post-correction methods enable a combination of high sampling rate, wide bandwidth and low distortion. In this paper the employed dynamic post-correction is a combination of look-up tables and model based correction. The results are mainly based on measurements on a 12-bit 210 MSPS ADC. The improvement in total harmonic distortion and spurious free dynamic range are acceptable over a wide frequency range and it is robust to variations in amplitude.

Place, publisher, year, edition, pages
2007. 58-62 p.
Series
IEEE Instrumentation & Measurement Technology Conference, Proceedings, ISSN 1091-5281
Keyword [en]
analog to digital converters, ADC, test, measurements, under-sampling, post-correction
National Category
Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN: urn:nbn:se:kth:diva-34930ISI: 000251296800012Scopus ID: 2-s2.0-34648826971ISBN: 978-1-4244-0588-6 (print)OAI: oai:DiVA.org:kth-34930DiVA: diva2:428846
Conference
24th IEEE Instrumentation and Measurement Technology Conference Warsaw, POLAND, MAY 01-03, 2007
Note
QC 20110701Available from: 2011-07-01 Created: 2011-06-17 Last updated: 2011-11-08Bibliographically approved

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Händel, Peter

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