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X-ray photoelectron diffraction investigation of the cleavage plane in IT-transition metal dichalcogenides
KTH, School of Information and Communication Technology (ICT), Microelectronics and Applied Physics, MAP.
2007 (English)In: Physica. B, Condensed matter, ISSN 0921-4526, Vol. 398, no 1, 172-177 p.Article in journal (Refereed) Published
Abstract [en]

We present a detailed study of the three members of the 1 T-transition metal dichalcogenides: TiSe2, TaSe2 and TaS2 by means of the X-ray photoelectron diffraction combined with single-scattering simulations. Our simulations of different surface terminations and their comparison with the measured diffraction patterns allow to determine that the cleavage occurs within the van der Waals gap. Singlescattering calculations are shown to simulate very well the measured diffractograms on these compounds.

Place, publisher, year, edition, pages
2007. Vol. 398, no 1, 172-177 p.
Keyword [en]
X-ray diffraction, scattering, computer simulations, single crystal surfaces, surface structure
National Category
Physical Sciences
URN: urn:nbn:se:kth:diva-37202DOI: 10.1016/j.physb.2007.05.014ISI: 000248932900030ScopusID: 2-s2.0-34347247319OAI: diva2:432564
Available from: 2011-08-04 Created: 2011-08-04 Last updated: 2011-08-04Bibliographically approved

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Stoltz, Dunja
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