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Optical conductivity and x-ray absorption and emission study of the band structure of MnN films
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2005 (English)In: Physical Review B. Condensed Matter and Materials Physics, ISSN 1098-0121, E-ISSN 1550-235X, Vol. 72, no 20, 205127- p.Article in journal (Refereed) Published
Abstract [en]

The band structure of MnN films prepared by ion assisted deposition has been investigated by optical conductivity and x-ray absorption and emission spectroscopies. X-ray diffraction and extended x-ray absorption fine structure show the films to be nanocrystalline but phase pure and exhibiting the known antiferromagnetic distorted rocksalt phase. X-ray emission spectroscopy of the N K-edge and x-ray absorption near edge spectroscopy of both the N K- and Mn L-edges are used to probe the occupied and empty densities of states, which compare well with the N(2p) and Mn(3d) partial densities of states calculated using the linearized muffin-tin orbital band structure method. A similar comparison is made between the measured optical conductivity and the calculated contribution from interband transitions. It is possible to associate the main features in the measured spectrum with corresponding ones in the calculated optical function. The major differences between calculated and measured spectra can be understood on the basis of a limited electron mean-free-path in these nanocrystalline films, which broadens the features in the joint density of states and relaxes the momentum conservation requirement. The calculated optical functions are analyzed in detail in terms of their dominant band-to-band contributions and in addition the polarization dependence is predicted. Temperature dependent conductivity measurements are also reported and show a clear metallic behavior and a weak Kondo-like low temperature anomaly.

Place, publisher, year, edition, pages
2005. Vol. 72, no 20, 205127- p.
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Physical Sciences
URN: urn:nbn:se:kth:diva-38221DOI: 10.1103/PhysRevB.72.205127ISI: 000233603900043ScopusID: 2-s2.0-29844446313OAI: diva2:436277
QC 20110823Available from: 2011-08-23 Created: 2011-08-23 Last updated: 2011-08-23Bibliographically approved

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Schmitt, Thorsten
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Semiconductor Materials, HMA
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