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Post-Correction of Analog-to-Digital Converters
KTH, Superseded Departments, Signals, Sensors and Systems.
KTH, Superseded Departments, Signals, Sensors and Systems.ORCID iD: 0000-0002-7926-5081
KTH, Superseded Departments, Signals, Sensors and Systems.ORCID iD: 0000-0002-2718-0262
2003 (English)Manuscript (preprint) (Other academic)
Abstract [en]

A dynamic post-correction method for ADCs is presented. The method utilizes bit-masking, and a tool for analyzing the effects thereof is proposed. This tool is used to calculate optimal bit allocations, in order to minimize the THD of the corrected ADC. An example based on experimental ADC data is presented.

Place, publisher, year, edition, pages
2003.
Keyword [en]
Dynamic correction, optimization, THD
National Category
Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN: urn:nbn:se:kth:diva-44269OAI: oai:DiVA.org:kth-44269DiVA: diva2:450605
Conference
Northern Lights Workshop on Sensors, Signals and Systems
Note
Abstract submitted to the “Northern Lights Workshop on Sensors, Signals & Systems”. January 27, 2003. Konferensen blev inställd QC 20111101Available from: 2011-11-01 Created: 2011-10-20 Last updated: 2011-11-21Bibliographically approved

Open Access in DiVA

fulltext(108 kB)251 downloads
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b8d3838daae7688f8a645784b73c2978788fc779ec1a91ee2424f390cf122962e3b58f6e0532312b31e8c5dc88b6cfbd436343078d94a1d716899a4ae0f4e08d
Type fulltextMimetype application/pdf

Authority records BETA

Skoglund, MikaelHändel, Peter

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CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf