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Characterizing the out-of-band Nonlinear Behavior of RF Devices: The Key to Success
KTH, School of Electrical Engineering (EES), Signal Processing. KTH, School of Electrical Engineering (EES), Centres, ACCESS Linnaeus Centre.
Vrije Universiteit Brussel, ELEC department.
Vrije Universiteit Brussel, ELEC department.
University of Gävle, Radio center for measurement technology.
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2011 (English)In: Conference Record - IEEE Instrumentation and Measurement Technology Conference, IEEE , 2011, 790-794 p.Conference paper (Refereed)
Abstract [en]

This paper presents a measurement recipe to characterize the out-of-band nonlinear behavior of RF devices when harmonic sampling is used as a digitizing technique. A major challenge to consider when using harmonic sampling is the overlapping of the aliased spectral bins of the digitized waveform. This challenge is more pronounced when using modulated excitation signals. In addition, the excitation signal used should mimic the real behavior of signals used in today's wireless systems. Hence, this paper provides the reader with a tool to select the proper excitation signal, sampling frequency and record length in order to achieve an accurate characterization of the nonlinear behavior of RF devices.

Place, publisher, year, edition, pages
IEEE , 2011. 790-794 p.
Keyword [en]
RF devices, multisines, harmonic sampling, large signal network analysis
National Category
Signal Processing
URN: urn:nbn:se:kth:diva-46738DOI: 10.1109/IMTC.2011.5944022ISI: 000297171900158ScopusID: 2-s2.0-80051886176ISBN: 978-1-4244-7933-7OAI: diva2:454116
2011 IEEE International Instrumentation and Measurement Technology Conference. Binjiang, Hangzhou. 10 May 2011 through 12 May 2011

QC 20111107

Available from: 2011-11-05 Created: 2011-11-05 Last updated: 2013-11-29Bibliographically approved

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Nader, CharlesBjörsell, NiclasHändel, Peter
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ReferencesLink to record
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