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Analyse de la tolérance de l’alignement d’un circuit de distribution optique intégré pour une application de capteur multiparamétrique jetable
KTH, School of Electrical Engineering (EES), Microsystem Technology.ORCID iD: 0000-0001-9008-8402
KTH, School of Electrical Engineering (EES), Microsystem Technology.
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2009 (French)In: Journées Nationales d’Optique Guidée (JNOG), Lille, France, 2009, 289-291 p.Conference paper, Published paper (Refereed)
Place, publisher, year, edition, pages
Lille, France, 2009. 289-291 p.
National Category
Other Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN: urn:nbn:se:kth:diva-47330OAI: oai:DiVA.org:kth-47330DiVA: diva2:454778
Conference
Journées Nationales d'Optique Guidée (JNOG), Lille, France, July 6-9, 2009
Note
QC 20111118. Poster presentation.Available from: 2011-11-08 Created: 2011-11-08 Last updated: 2011-11-18Bibliographically approved

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Gylfason, Kristinn B.Sohlström, Hans

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CiteExportLink to record
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Citation style
  • apa
  • harvard1
  • ieee
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  • de-DE
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