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Optical and Electrical Characterization at the Nanoscale by a Transparent Tip of a Scanning Tunneling Microscope
NTT Basic Research Labs.ORCID iD: 0000-0003-2562-0540
NTT Basic Research Labs.
NTT Basic Research Labs.
NTT Basic Research Labs.
2009 (English)In: Nanotechnology, ISSN 0957-4484, E-ISSN 1361-6528, Vol. 20, no 14, 145706- p.Article in journal (Refereed) Published
Abstract [en]

A new type of scanning probe microscope, combining features of the scanning tunnelling microscope, the scanning tunnelling luminescence microscope with a transparent probe and the aperture scanning near-field optical microscope, is described. Proof-of-concept experiments were performed under ultrahigh vacuum conditions at varying temperature on GaAs/AlAs heterostructures.

Place, publisher, year, edition, pages
Institute of Physics Publishing (IOPP), 2009. Vol. 20, no 14, 145706- p.
Keyword [en]
luminescence, near-field, STM, STML, SNOM
National Category
Atom and Molecular Physics and Optics
Identifiers
URN: urn:nbn:se:kth:diva-48934DOI: 10.1088/0957-4484/20/14/145706ISI: 000264539500021OAI: oai:DiVA.org:kth-48934DiVA: diva2:458878
Note
QC 20111129Available from: 2012-01-27 Created: 2011-11-24 Last updated: 2017-12-08Bibliographically approved

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Sychugov, Ilya

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