Atomic structure of a thin silica film on a Mo(112) substrate: A two-dimensional network of SiO4 tetrahedra
2005 (English)In: Physical Review Letters, ISSN 0031-9007, Vol. 95, no 7, 1-4 p.Article in journal (Refereed) Published
The structure of a thin single crystalline SiO2 film grown on Mo(112) has been studied by scanning tunneling microscopy, infrared reflection absorption spectroscopy, and x-ray photoelectron spectroscopy. In excellent agreement with the experimental results, density functional theory calculations show that the film consists of a two-dimensional network of corner sharing [SiO4] tetrahedra, with one oxygen of each tetrahedron binding to the protruding Mo atoms of the Mo(112) surface.
Place, publisher, year, edition, pages
2005. Vol. 95, no 7, 1-4 p.
Other Physics Topics
IdentifiersURN: urn:nbn:se:kth:diva-49036DOI: 10.1103/PhysRevLett.95.076103ISI: 000231247300038OAI: oai:DiVA.org:kth-49036DiVA: diva2:459140
QC 201111282011-11-242011-11-242011-11-28Bibliographically approved