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Atomic structure of a thin silica film on a Mo(112) substrate: A two-dimensional network of SiO4 tetrahedra
Fritz Haber Institute. (Chemical Physics)ORCID iD: 0000-0003-1631-4293
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2005 (English)In: Physical Review Letters, ISSN 0031-9007, Vol. 95, no 7, 1-4 p.Article in journal (Refereed) Published
Abstract [en]

The structure of a thin single crystalline SiO2 film grown on Mo(112) has been studied by scanning tunneling microscopy, infrared reflection absorption spectroscopy, and x-ray photoelectron spectroscopy. In excellent agreement with the experimental results, density functional theory calculations show that the film consists of a two-dimensional network of corner sharing [SiO4] tetrahedra, with one oxygen of each tetrahedron binding to the protruding Mo atoms of the Mo(112) surface.

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2005. Vol. 95, no 7, 1-4 p.
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URN: urn:nbn:se:kth:diva-49036DOI: 10.1103/PhysRevLett.95.076103ISI: 000231247300038OAI: diva2:459140
QC 20111128Available from: 2011-11-24 Created: 2011-11-24 Last updated: 2011-11-28Bibliographically approved

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Weissenrieder, Jonas
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