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Four-dimensional ultrafast electron microscopy of phase transitions
California Institute of Technology.ORCID iD: 0000-0003-1631-4293
2006 (English)In: Proceedings of the National Academy of Sciences of the United States of America, ISSN 0027-8424, E-ISSN 1091-6490, Vol. 103, no 49, 18427-18431 p.Article in journal (Refereed) Published
Abstract [en]

Reported here is direct imaging (and diffraction) by using 4D ultrafast electron microscopy (UEM) with combined spatial and temporal resolutions. In the first phase of UEM, it was possible to obtain snapshot images by using timed, single-electron packets; each packet is free of space-charge effects. Here, we demonstrate the ability to obtain sequences of snapshots (”movies”) with atomic-scale spatial resolution and ultrashort temporal resolution. Specifically, it is shown that ultrafast metal-insulator phase transitions can be studied with these achieved spatial and temporal resolutions. The diffraction (atomic scale) and images (nanometer scale) we obtained manifest the structural phase transition with its characteristic hysteresis, and the time scale involved (100 fs) is now studied by directly monitoring coordinates of the atoms themselves.

Place, publisher, year, edition, pages
2006. Vol. 103, no 49, 18427-18431 p.
Keyword [en]
imaging; diffraction; electron crystallography; vanadium dioxide
National Category
Other Physics Topics
URN: urn:nbn:se:kth:diva-49024DOI: 10.1073/pnas.0609233103ISI: 000242689800011OAI: diva2:459147
QC 20111130Available from: 2011-11-24 Created: 2011-11-24 Last updated: 2011-11-30Bibliographically approved

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Weissenrieder, Jonas
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