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Test Procedures and Classification Method of Facilities for Intentional Electromagnetic Interference (IEMI)
High Voltage Valley.ORCID iD: 0000-0003-4740-1832
KTH, School of Electrical Engineering (EES), Electromagnetic Engineering.ORCID iD: 0000-0002-1607-2493
Combitech AB.
2009 (English)Conference paper, Published paper (Refereed)
Abstract [en]

Due to the internal complexity, the human intent and the large physical distribution of a facility, a classification of its vulnerability to intentional EMI founded on shielding effectiveness is deemed inadequate. In the power network of a facility, low-level differential mode ultra wideband transients were injected and the received voltages at different ports (power sockets) were measured. The results were processed using statistical methods and were used to form an alternative method for classifying facilities or large distributed systems.

Place, publisher, year, edition, pages
2009.
National Category
Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN: urn:nbn:se:kth:diva-51084OAI: oai:DiVA.org:kth-51084DiVA: diva2:463362
Conference
Electronic Environment 2009. Stockholm, SWE. March 2009
Note
QC 20111212Available from: 2011-12-09 Created: 2011-12-09 Last updated: 2011-12-12Bibliographically approved

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Månsson, DanielThottappillil, Rajeev

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