ADC Characterization By Dynamic Integral Nonlinearity
2008 (English)In: 13th Workshop on ADC Modelling and Testing, 2008, 1037-1042 p.Conference paper (Refereed)
Wide band characterization of analog-digital converter integral nonlinearity (INL) based on parametric modeling and least-squares parameter ﬁt is performed. In particular, the variations in the INL due to the frequency of theADC stimuli are modeled. The INL is divided into two main entities describing the static and dynamic behavior of theADC, respectively. The static component is modeled by a high code component (HCF) of piecewise linear segmentscentered around zero. A static low code (LCF) polynomial inherent to the INL data is added to the segments to complete the static part of the model. The INL dynamic part is modeled by an LCF polynomial. Method implementationis considered and is applied to 12-bit ADC data at 210 MSPS.
Place, publisher, year, edition, pages
2008. 1037-1042 p.
analog-digital converter, integral nonlinearity (INL), static component, high code component (HCF), static low code (LCF) polynomial
IdentifiersURN: urn:nbn:se:kth:diva-65724ScopusID: 2-s2.0-77955314616OAI: oai:DiVA.org:kth-65724DiVA: diva2:483556
IMEKO 13th Workshop on ADC Modelling and Testing. Florence, Italy. September 22-24, 2008
QC 201205082012-01-252012-01-252012-05-08Bibliographically approved