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Self-Checking Checker for 1-out-of-n Code Based on Current-Mode CMOS Logic
KTH, School of Information and Communication Technology (ICT), Electronic Systems.
KTH, School of Information and Communication Technology (ICT), Electronic Systems.
2002 (English)In: Proceedings of Defect and Fault Tolerance in VLSI Systems Conference, DFT2002, 2002Conference paper, Published paper (Refereed)
Place, publisher, year, edition, pages
2002.
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Electrical Engineering, Electronic Engineering, Information Engineering
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URN: urn:nbn:se:kth:diva-62773OAI: oai:DiVA.org:kth-62773DiVA: diva2:484531
Note
NR 20140805Available from: 2012-01-27 Created: 2012-01-20 Last updated: 2012-01-27Bibliographically approved

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CiteExportLink to record
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Citation style
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
  • vancouver
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Language
  • de-DE
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