Local tomography in electron microscopy
2008 (English)In: SIAM Journal on Applied Mathematics, ISSN 0036-1399, E-ISSN 1095-712X, Vol. 68, no 5, 1282-1303 p.Article in journal (Refereed) Published
We present a new local tomographic algorithm applicable to electron microscope tomography. Our algorithm applies to the standard data acquisition method, single-axis tilting, as well as to more arbitrary acquisition methods including double axis and conical tilt. Using microlocal analysis we put the reconstructions in a mathematical context, explaining which singularities are stably visible from the limited data given by the data collection protocol in the electron microscope. Finally, we provide reconstructions of real specimens from electron tomography data.
Place, publisher, year, edition, pages
Society for Industrial and Applied Mathematics, 2008. Vol. 68, no 5, 1282-1303 p.
X-ray transform, limited data tomography, microlocal analysis, Lambda tomography, electron tomography
Research subject SRA - E-Science (SeRC); SRA - Molecular Bioscience
IdentifiersURN: urn:nbn:se:kth:diva-71132DOI: 10.1137/07068326XISI: 000256452500005OAI: oai:DiVA.org:kth-71132DiVA: diva2:486603
FunderSwedish e‐Science Research Center
QC 201201312012-01-302012-01-302012-01-31Bibliographically approved