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Local tomography in electron microscopy
Sidec Technologies, Kista, Sweden.ORCID iD: 0000-0002-1118-6483
Tufts University. (Department of Mathematics)
2008 (English)In: SIAM Journal on Applied Mathematics, ISSN 0036-1399, E-ISSN 1095-712X, Vol. 68, no 5, 1282-1303 p.Article in journal (Refereed) Published
Abstract [en]

We present a new local tomographic algorithm applicable to electron microscope tomography. Our algorithm applies to the standard data acquisition method, single-axis tilting, as well as to more arbitrary acquisition methods including double axis and conical tilt. Using microlocal analysis we put the reconstructions in a mathematical context, explaining which singularities are stably visible from the limited data given by the data collection protocol in the electron microscope. Finally, we provide reconstructions of real specimens from electron tomography data.

Place, publisher, year, edition, pages
Society for Industrial and Applied Mathematics, 2008. Vol. 68, no 5, 1282-1303 p.
Keyword [en]
X-ray transform, limited data tomography, microlocal analysis, Lambda tomography, electron tomography
National Category
Mathematical Analysis
Research subject
SRA - E-Science (SeRC); SRA - Molecular Bioscience
URN: urn:nbn:se:kth:diva-71132DOI: 10.1137/07068326XISI: 000256452500005OAI: diva2:486603
Swedish e‐Science Research Center
QC 20120131Available from: 2012-01-30 Created: 2012-01-30 Last updated: 2012-01-31Bibliographically approved

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Öktem, Ozan
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