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Towards Soft X-Ray Phase-Sensitive Imaging with Diffractive Optical Elements
KTH, School of Engineering Sciences (SCI), Applied Physics, Biomedical and X-ray Physics.ORCID iD: 0000-0002-4394-0591
KTH, School of Engineering Sciences (SCI), Applied Physics, Biomedical and X-ray Physics.
KTH, School of Engineering Sciences (SCI), Applied Physics, Biomedical and X-ray Physics.
KTH, School of Engineering Sciences (SCI), Applied Physics, Biomedical and X-ray Physics.
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2006 (English)In: Proc. 8th International Conference X-ray Microscopy, 2006, 91-93 p.Conference paper, Published paper (Refereed)
Abstract [en]

In this contribution we present the first diffractive optical elements for soft x-ray differential interference contrast microscopy.Due to an improved calculation method the nanofabrication accuracy of these optics is the same as for comparable normal zoneplate optics with the same outermost zone width. Different diffractive optical elements were fabricated with outermost zone widthof 100 nm, different spot separation directions and different phase relations between the two spots. The optics were successfullyused in experiments both at the synchrotron radiation based TWINMIC microscope and at the Stockholm compact liquid-nitrogenlaser-plasma source based microscope.

Place, publisher, year, edition, pages
2006. 91-93 p.
Series
IPAP Conf. Series, 7
Keyword [en]
X-ray microscopy, differential interference contrast, diffractive optics
National Category
Atom and Molecular Physics and Optics
Identifiers
URN: urn:nbn:se:kth:diva-73338OAI: oai:DiVA.org:kth-73338DiVA: diva2:488796
Conference
XRM2005: The 8th International Conference on X-ray Microscopy. Egret Himeji, Japan. 26-30 July 2005
Note
QC 20120531Available from: 2012-02-02 Created: 2012-02-02 Last updated: 2012-05-31Bibliographically approved

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Vogt, UlrichHolmberg, AndersHertz, Hans

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Vogt, UlrichLindblom, MagnusJansson, Per A. C.Tuohimaa, Tomi T.Holmberg, AndersHertz, Hans
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