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Electron-Impact Water-Jet Microfocus Source for Water-Window Microscopy
KTH, School of Engineering Sciences (SCI), Applied Physics, Biomedical and X-ray Physics.
KTH, School of Engineering Sciences (SCI), Applied Physics, Biomedical and X-ray Physics.ORCID iD: 0000-0001-7637-1850
KTH, School of Engineering Sciences (SCI), Applied Physics, Biomedical and X-ray Physics.ORCID iD: 0000-0002-4394-0591
KTH, School of Engineering Sciences (SCI), Applied Physics, Biomedical and X-ray Physics.
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2011 (English)In: 10th International Conference on X-Ray Microscopy / [ed] McNulty, I; Eyberger, C; Lai, B, 2011, Vol. 1365, 152-155 p.Conference paper, Published paper (Refereed)
Abstract [en]

We demonstrate high-brightness operation of an electron-impact water-jet-anode soft x-ray source with an increased power loading of 15 times compared to our previously published results, with a corresponding increase in similar to 525-eV x-ray intensity of 6.4 times. This has been accomplished by improving the vacuum pumping system and the electron focusing optics, and increasing the liquid-jet velocity. The source now operates up to 120-W e-beam power and at a 525-eV brightness of 3.5x10(9) ph/(sx mu m(2)xsrxline). The source concept has potential to increase the x-ray brightness by another order of magnitude by optimizing the e-beam focusing and upgrading the power supply. Currently, spot enlargement with increased power is determined to be the most important limiting factor.

Place, publisher, year, edition, pages
2011. Vol. 1365, 152-155 p.
Series
AIP Conference Proceedings, ISSN 0094-243X ; 1365
Keyword [en]
X-ray beamlines; light absorption; electron beams; X-ray spectra
National Category
Accelerator Physics and Instrumentation
Identifiers
URN: urn:nbn:se:kth:diva-73360DOI: 10.1063/1.3625327ISI: 000298672400034Scopus ID: 2-s2.0-80053340271OAI: oai:DiVA.org:kth-73360DiVA: diva2:488817
Conference
10th International Conference on X-ray Microscopy. Univ Chicago, Chicago, IL. AUG 15-20, 2010
Note
QC 20120203. Updated from manuscript.Available from: 2012-02-02 Created: 2012-02-02 Last updated: 2014-01-14Bibliographically approved
In thesis
1. Electron-Impact Liquid-Jet Water-Window X-ray Sources
Open this publication in new window or tab >>Electron-Impact Liquid-Jet Water-Window X-ray Sources
2010 (English)Licentiate thesis, comprehensive summary (Other academic)
Abstract [en]

This Thesis describes the development and characterization of a soft x-ray liquidjet-anode electron-impact source. With a water-jet target the primary emission is the O Kα line at 525 eV. This is close to the lower edge of the water-window, a spectral region lacking simple laboratory sources. In the hard x-ray regime electronimpact microfocus sources have matured and are simple, stable, reliable, and inexpensive. It would be beneficial if this source concept could be used also for soft x-ray generation.  

Spectral measurements of a 120 W, 30 keV electron beam focused on a 20 μm water jet show an x-ray intensity of up to 3.2 × 1012 ph/(s×sr×line). Combined with source size measurements up to 50 W a maximum brightness of 3.5 × 109 ph/(s×μm2×sr×line) is reported. This makes the brightness comparable to the compact discharge-plasma sources presently used for soft x-ray microscopy. The source appears to be scalable another order of magnitude which would make the brightness equal to that of the laser-plasma sources.

 

Place, publisher, year, edition, pages
Stockholm: Universitetsservice US AB, 2010. xiii, 37 p.
Series
Trita-FYS, ISSN 0280-316X ; 2010:68
National Category
Engineering and Technology
Identifiers
urn:nbn:se:kth:diva-28622 (URN)978-91-7415-825-0 (ISBN)
Presentation
2010-12-10, Sal FB42, KTH, Roslagstullsbacken 21, AlbaNova, Stockholm, 10:00
Opponent
Supervisors
Note
QC 20110119Available from: 2011-01-19 Created: 2011-01-18 Last updated: 2012-04-02Bibliographically approved

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Lundström, UlfVogt, UlrichHertz, Hans

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