Electron-Impact Water-Jet Microfocus Source for Water-Window Microscopy
2011 (English)In: 10th International Conference on X-Ray Microscopy / [ed] McNulty, I; Eyberger, C; Lai, B, 2011, Vol. 1365, 152-155 p.Conference paper (Refereed)
We demonstrate high-brightness operation of an electron-impact water-jet-anode soft x-ray source with an increased power loading of 15 times compared to our previously published results, with a corresponding increase in similar to 525-eV x-ray intensity of 6.4 times. This has been accomplished by improving the vacuum pumping system and the electron focusing optics, and increasing the liquid-jet velocity. The source now operates up to 120-W e-beam power and at a 525-eV brightness of 3.5x10(9) ph/(sx mu m(2)xsrxline). The source concept has potential to increase the x-ray brightness by another order of magnitude by optimizing the e-beam focusing and upgrading the power supply. Currently, spot enlargement with increased power is determined to be the most important limiting factor.
Place, publisher, year, edition, pages
2011. Vol. 1365, 152-155 p.
, AIP Conference Proceedings, ISSN 0094-243X ; 1365
X-ray beamlines; light absorption; electron beams; X-ray spectra
Accelerator Physics and Instrumentation
IdentifiersURN: urn:nbn:se:kth:diva-73360DOI: 10.1063/1.3625327ISI: 000298672400034ScopusID: 2-s2.0-80053340271OAI: oai:DiVA.org:kth-73360DiVA: diva2:488817
10th International Conference on X-ray Microscopy. Univ Chicago, Chicago, IL. AUG 15-20, 2010
QC 20120203. Updated from manuscript.2012-02-022012-02-022014-01-14Bibliographically approved