Simulations of internal coupling of disturbances due to external radiation in electronic systems using random coupling model
Independent thesis Advanced level (degree of Master (Two Years)), 20 credits / 30 HE creditsStudent thesis
All electronic equipment emits and absorbs Electromagnetic Radiation of different frequencies. This unwanted emission and absorption of radiation can result in spectrum pollution, leading to interference in the working of other equipment and systems. Electromagnetic Compatibility is the ability of a piece of equipment or a system to function as designed without degradation or malfunction of the equipment or other nearby electronic systems in its intended operational electromagnetic environment. The energy transmitted by external radiation induces voltages across electronic components in a system which may lead to unpredictable surges, short circuitry and so on. To prevent this from occurring, all electronic equipment is manually tested for a wide range of frequencies and changes are made to the design accordingly. Naturally this is both a time-consuming and expensive process. A new approach is proposed, where the induced voltages across a system can be predicted using a statistical model called the Random Coupling Model (RCM). By getting a statistical estimate of the extent to which EMI affects the system, it is possible to rectify the design. In this study, a practical system (a standard computer) is taken and the extent of EMI is quantified using this method. Then two different methods are used to reduce the net induced voltage due to EMI and they are compared. The results obtained show that this method has the potential to rectify the problems of the manual testing method as mentioned above.
Place, publisher, year, edition, pages
EES Examensarbete / Master Thesis, XR-EE-ETK 2009:012
Electrical Engineering, Electronic Engineering, Information Engineering
IdentifiersURN: urn:nbn:se:kth:diva-74694OAI: oai:DiVA.org:kth-74694DiVA: diva2:489866
Norgren, Martin, Univ lektor