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Towards a test vector independent test response analyser for NoCs
HDC AB, Sweden.
KTH, School of Information and Communication Technology (ICT), Electronic, Computer and Software Systems, ECS.ORCID iD: 0000-0002-8072-1742
2007 (English)Conference paper, Poster (with or without abstract) (Refereed)
Place, publisher, year, edition, pages
2007.
National Category
Other Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN: urn:nbn:se:kth:diva-78810OAI: oai:DiVA.org:kth-78810DiVA: diva2:492897
Conference
12th IEEE European Test Symposium Convention Center. Freiburg, Germany. May 20-24, 2007
Note
QC 20120516Available from: 2012-02-08 Created: 2012-02-08 Last updated: 2012-05-16Bibliographically approved

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Öberg, Johnny

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CiteExportLink to record
Permanent link

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Citation style
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
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Output format
  • html
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