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Towards an almost c-testable NoC test strategy
KTH, School of Information and Communication Technology (ICT), Electronic, Computer and Software Systems, ECS.
Jönköpings Tekniska Högskola.
KTH, School of Information and Communication Technology (ICT), Electronic, Computer and Software Systems, ECS.ORCID iD: 0000-0002-8072-1742
2007 (English)In: Proceedings of the IEEE East-West Design and Test Symposium, 2007Conference paper, Published paper (Refereed)
Place, publisher, year, edition, pages
2007.
National Category
Other Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN: urn:nbn:se:kth:diva-78820OAI: oai:DiVA.org:kth-78820DiVA: diva2:492913
Conference
IEEE 5th East-West Design and Test Symposium, EWDTS-07. Yerevan, Armenia. 7-10 September 2007
Note
Best Paper Award. QC 20120516Available from: 2012-02-08 Created: 2012-02-08 Last updated: 2012-05-16Bibliographically approved

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CiteExportLink to record
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  • apa
  • harvard1
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