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An (almost) c-testable BIST strategy for NoCs
KTH, School of Information and Communication Technology (ICT), Electronic, Computer and Software Systems, ECS.
KTH, School of Information and Communication Technology (ICT), Electronic, Computer and Software Systems, ECS.ORCID iD: 0000-0002-8072-1742
2009 (English)In: Proceedings of Nordic Test Forum 2009, 2009Conference paper, Published paper (Refereed)
Place, publisher, year, edition, pages
2009.
National Category
Other Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN: urn:nbn:se:kth:diva-78904OAI: oai:DiVA.org:kth-78904DiVA: diva2:492992
Conference
NTF-2009. Stockholm, Sweden. December 1st-2nd, 2009
Note
QC 20120425Available from: 2012-02-08 Created: 2012-02-08 Last updated: 2012-04-25Bibliographically approved

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Öberg, Johnny

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