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On Gaussian and Sine Wave Histogram Tests for Wideband Applications
KTH, School of Electrical Engineering (EES), Signal Processing. KTH, School of Electrical Engineering (EES), Centres, ACCESS Linnaeus Centre.ORCID iD: 0000-0002-2718-0262
2005 (English)In: Proceedings of the IEEE Instrumentation and Measurement Technology Conference, IEEE , 2005, 677-682 p.Conference paper (Refereed)
Abstract [en]

Characterization and testing of analog-to-digital converters (ADCs) are interesting in many different aspects. Histogram test is a common method to characterize the linearity features of an ADC. Two commonly used stimuli signals are sine waves and Gaussian noise. This paper will present a metrological comparison between Gaussian and sine wave histogram tests for wideband applications; that is evaluate the performance in characterization of the ADC and the usability of post-correction. A post-correction procedure involves characterization of the ADC non-linearity and then utilization of this information by processing the ADC output samples to remove the distortion. The results indicates that even though the Gaussian histogram test seems to give reasonable accuracy to measure non-linearities it is not thereby a suitable model for post-correction. A single-tone sine wave histogram will most likely be a better solution. Best result is to train the look-up table with several single-tone sine waves in the frequency band.

Place, publisher, year, edition, pages
IEEE , 2005. 677-682 p.
, IEEE Instrumentation and Measurement Technology Conference. Proceedings, ISSN 1091-5281 ; 1
Keyword [en]
ADC, Analog to Digital Converters, Histogram, Measurements, Test
National Category
Signal Processing
URN: urn:nbn:se:kth:diva-82920ScopusID: 2-s2.0-33847219035ISBN: 978-078038879-6OAI: diva2:498580
IMTC'05 - Proceedings of the IEEE Instrumentation and Measurement Technology Conference; Ottawa, ON; 16 May 2005 through 19 May 2005
QC 20120313Available from: 2012-02-12 Created: 2012-02-12 Last updated: 2012-03-13Bibliographically approved

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Händel, Peter
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Signal ProcessingACCESS Linnaeus Centre
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