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Dynamic behavior models of analog to digital converters aimed for post-correction in wideband applications
KTH, School of Electrical Engineering (EES), Signal Processing. KTH, School of Electrical Engineering (EES), Centres, ACCESS Linnaeus Centre.ORCID iD: 0000-0002-2718-0262
2006 (English)In: 18th IMEKO World Congress 2006: Metrology for a Sustainable Development, 2006, 1344-1348 p.Conference paper, Published paper (Refereed)
Abstract [en]

In this paper a dynamic behavior model of analog to digital converters is proposed. The model is aimed for post correction in wideband applications. The suggested post correction method is a combination of look up tables and model based correction.The model consists of three components. The first is a component represented by a Hammerstein model; that is a static nonlinearity followed by a time invariant linear filter. The second component is a nonparametric model caused by significant deviation from the characterized integral nonlinearity and the output from the Hammerstein model. The third component contains of the remaining deviation and is considered as a random model error.Results from simulations verify that the examined ADC can be described by an ordinary Hammerstein model and a static look-up table.

Place, publisher, year, edition, pages
2006. 1344-1348 p.
Keyword [en]
Analog to digital converters, modeling, wideband applications
National Category
Signal Processing
Identifiers
URN: urn:nbn:se:kth:diva-82923Scopus ID: 2-s2.0-84877775320ISBN: 978-162276646-8 (print)OAI: oai:DiVA.org:kth-82923DiVA: diva2:498586
Conference
11th workshop on adc modelling and testing. Rio de Janeiro, Brazil. September 17-22, 2006
Note

QC 20120525

Available from: 2012-02-12 Created: 2012-02-12 Last updated: 2014-11-04Bibliographically approved

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Händel, Peter

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