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DETERMINATION OF INTERFACE STATES FOR CAF2/SI(111) FROM NEAR-EDGE X-RAY-ABSORPTION MEASUREMENTS
KTH, School of Information and Communication Technology (ICT). (Materialfysik)
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1986 (English)In: Physical Review Letters, ISSN 0031-9007, E-ISSN 1079-7114, Vol. 56, no 14, 1497-1500 p.Article in journal (Refereed) Published
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1986. Vol. 56, no 14, 1497-1500 p.
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Natural Sciences
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URN: urn:nbn:se:kth:diva-84169DOI: 10.1103/PhysRevLett.56.1497ISI: A1986A719100019OAI: oai:DiVA.org:kth-84169DiVA: diva2:499232
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NR 20140805Available from: 2012-02-13 Created: 2012-02-13 Last updated: 2017-12-07Bibliographically approved

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