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Toward a Standardized Multi-Sinewave Fit Algorithm
KTH, Superseded Departments, Signals, Sensors and Systems.
KTH, Superseded Departments, Signals, Sensors and Systems.ORCID iD: 0000-0002-2718-0262
2004 (English)In: 9th European Workshop on ADC Modelling and Testing, 2004, Vol. 1, 337-342 p.Conference paper (Refereed)
Abstract [en]

Multi-sinewave test methods require algorithms for multiple-tone parameter estimation.There exist a vast amount of publications on the topic [1]. This paper presents a generalization ofthe IEEE four-parameter sinewave fit algorithm suitable to handle data comprising multiple sinewaves.The proposed method directly estimates the 3p + 1 parameters of a p-tone model. The algorithmis analyzed numerically with emphasize on its convergence properties and statistical efficiency. Theinitialization of the algorithm is of major importance and an attempt to formulate a proper initializationprocedure is presented.

Place, publisher, year, edition, pages
2004. Vol. 1, 337-342 p.
Keyword [en]
Algorithms, Industrial research, Testing, Convergence properties, Initialization procedures, Sine wave test, Sine-wave, Sinewaves, Statistical efficiency, Tone modeling, Parameter estimation
National Category
Signal Processing
URN: urn:nbn:se:kth:diva-85978ScopusID: 2-s2.0-84910625636ISBN: 9781634391849OAI: diva2:500260

QC 20120229

Available from: 2012-02-13 Created: 2012-02-13 Last updated: 2015-12-01Bibliographically approved

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