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Dielectric issues for silicon carbide MOS devices
KTH, School of Information and Communication Technology (ICT), Integrated Devices and Circuits.ORCID iD: 0000-0001-8108-2631
1998 (English)In: 29th IEEE Semiconductor Interface Specialists Conference, 1998Conference paper, Published paper (Refereed)
Place, publisher, year, edition, pages
1998.
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Other Electrical Engineering, Electronic Engineering, Information Engineering
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URN: urn:nbn:se:kth:diva-86044OAI: oai:DiVA.org:kth-86044DiVA: diva2:500361
Conference
IEEE SISC 1998
Note
NR 20140805Available from: 2012-02-13 Created: 2012-02-13Bibliographically approved

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Zetterling, Carl-Mikael

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