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Characteristics of PZT/Al2O3 stack on SiC demonstrated in a NVFET
KTH, School of Information and Communication Technology (ICT), Integrated Devices and Circuits.ORCID iD: 0000-0001-8108-2631
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2003 (English)In: 34th IEEE Semicondctor Interface Specialists Conference, 2003, 2003Conference paper, Published paper (Refereed)
Place, publisher, year, edition, pages
2003.
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Other Electrical Engineering, Electronic Engineering, Information Engineering
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URN: urn:nbn:se:kth:diva-86087OAI: oai:DiVA.org:kth-86087DiVA: diva2:500394
Conference
IEEE SISC 2003
Note
NR 20140805Available from: 2012-02-13 Created: 2012-02-13Bibliographically approved

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Zetterling, Carl-Mikael

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