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Influence of SOI-generated stress on BiCMOS performance
KTH, School of Information and Communication Technology (ICT), Integrated Devices and Circuits.
KTH, School of Information and Communication Technology (ICT), Integrated Devices and Circuits. (EKT)ORCID iD: 0000-0001-6459-749X
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2005 (English)In: Semiconductor Device Research Symposium, 2005 International, 2005, 444-445 p.Conference paper, Published paper (Refereed)
Place, publisher, year, edition, pages
2005. 444-445 p.
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Electrical Engineering, Electronic Engineering, Information Engineering
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URN: urn:nbn:se:kth:diva-87026DOI: 10.1109/ISDRS.2005.1596177Scopus ID: 2-s2.0-33847186638OAI: oai:DiVA.org:kth-87026DiVA: diva2:501297
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Semiconductor Device Research Symposium, 2005 International
Note
QC 20120222Available from: 2012-02-14 Created: 2012-02-14 Last updated: 2012-02-22Bibliographically approved

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Malm, Gunnar

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