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Reliability study of fault-tolerant multiwavelength nonblocking optical cross connect based on InGaAsP/InP laser-amplifier gate-switch arrays
KTH, School of Information and Communication Technology (ICT), Communication Systems, CoS. (NEGONET)ORCID iD: 0000-0001-6704-6554
1993 (English)In: IEEE Photonics Technology Letters, ISSN 1041-1135, E-ISSN 1941-0174, Vol. 5, 1206-1209 p.Article in journal (Refereed) Published
Abstract [en]

Reliability studies for a multiwavelength nonblocking optical cross connect (OXC) are presented. Calculations are based on available reliability data for commercial components as well as expected life lengths for new components and systems developed for application in the OXC. Reliability of the electronic control system is not considered here. Average OXC downtime below 2 min/year can be obtained. In general for switching systems it is required that average downtime is held below 3 min/year. As the OXC is proposed to be utilized in telecommunication in optical transport networks it is extremely important to know if this OXC exhibits reliability properties acceptable for this purpose.<>

Place, publisher, year, edition, pages
1993. Vol. 5, 1206-1209 p.
Keyword [en]
GaAsP-InP;InGaAsP/InP laser-amplifier gate-switch arrays;OXC downtime;commercial components;electronic control system;fault-tolerant;multiwavelength nonblocking optical cross connect;optical transport networks;reliability data;reliability study;switching systems;telecommunication;gallium arsenide;gallium compounds;indium compounds;optical communication equipment;optical switches;optical testing;reliability;semiconductor device testing;semiconductor laser arrays;semiconductor switches;
National Category
URN: urn:nbn:se:kth:diva-87492DOI: 10.1109/68.248429OAI: diva2:501710
NR 20140805Available from: 2012-02-14 Created: 2012-02-14 Last updated: 2012-02-14Bibliographically approved

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Wosinska, Lena
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