Change search
CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf
A Fast and Accurate Phase Noise Measurement of Free Running Oscillators Using a Single Spectrum Analyzer
KTH, School of Information and Communication Technology (ICT), Centres, VinnExcellence Center for Intelligence in Paper and Packaging, iPACK. KTH, School of Information and Communication Technology (ICT), Electronic Systems.
KTH, School of Information and Communication Technology (ICT), Centres, VinnExcellence Center for Intelligence in Paper and Packaging, iPACK. KTH, School of Information and Communication Technology (ICT), Electronic Systems.
KTH, School of Information and Communication Technology (ICT), Centres, VinnExcellence Center for Intelligence in Paper and Packaging, iPACK. KTH, School of Information and Communication Technology (ICT), Electronic Systems.
2010 (English)In: 28th Norchip Conference, NORCHIP 2010, 2010Conference paper, Published paper (Refereed)
Abstract [en]

This paper presents a practical phase noise measurement approach, which only requires a spectrum analyzer and a computer, featuring fast setups, accurate results and low cost. Not like the conventional methods using extra assistant circuits to get rid of the frequency drift problem, this approach takes advantage of modern spectrum analyzers to acquire IQ data to calculate phase noise. The low quantization noise of the instrument makes this approach suitable for most CMOS integrated oscillators. The IQ data sampling time can be made small enough so that the frequency drift is not so obvious to harm the measurement accuracy. The experimental results clearly demonstrates the accuracy and the effectiveness of this method through measuring phase noise of two voltage controlled oscillators (VCOs) in 180nm CMOS process at 2.6 GHz and 3.0 GHz respectively.

Place, publisher, year, edition, pages
2010.
Keyword [en]
CMOS processs, Conventional methods, Data sampling, Free-running oscillators, Frequency drifts, Integrated oscillators, Low costs, Measurement accuracy, Phase noise measurement, Quantization noise, Voltage controlled oscillator
National Category
Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN: urn:nbn:se:kth:diva-83641DOI: 10.1109/NORCHIP.2010.5669431Scopus ID: 2-s2.0-78751520352OAI: oai:DiVA.org:kth-83641DiVA: diva2:502482
Conference
IEEE Norchip 2010
Note
QC 20120215Available from: 2012-02-14 Created: 2012-02-12 Last updated: 2012-02-15Bibliographically approved

Open Access in DiVA

No full text

Other links

Publisher's full textScopus

Search in DiVA

By author/editor
Chen, JianJonsson, FredrikZheng, Li-Rong
By organisation
VinnExcellence Center for Intelligence in Paper and Packaging, iPACKElectronic Systems
Electrical Engineering, Electronic Engineering, Information Engineering

Search outside of DiVA

GoogleGoogle Scholar

doi
urn-nbn

Altmetric score

doi
urn-nbn
Total: 60 hits
CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf