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Linewidth Enhancement Factor of Semiconductor Lasers: Results from Round-Robin Measurements in COST 288
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2007 (English)In: 2007 CONFERENCE ON LASERS & ELECTRO-OPTICS/QUANTUM ELECTRONICS AND LASER SCIENCE CONFERENCE (CLEO/QELS 2007), VOLS 1-5, 2007Conference paper, Published paper (Refereed)
Abstract [en]

Round-robin measurements on the linewidth enhancement factor are carried out within several laboratories participating to EU COST 288 action. The alpha-factor is measured by applying up to 7 different techniques. The obtained results are compared.

Place, publisher, year, edition, pages
2007.
Keyword [en]
COST 288;linewidth enhancement factor;round-robin measurements;semiconductor lasers;semiconductor lasers;
National Category
Telecommunications Atom and Molecular Physics and Optics
Identifiers
URN: urn:nbn:se:kth:diva-88022DOI: 10.1109/CLEO.2007.4452795ISI: 000268751001028Scopus ID: 2-s2.0-84898939506OAI: oai:DiVA.org:kth-88022DiVA: diva2:502522
Conference
Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference. Baltimore, MD. MAY 06-11, 2007
Note
QC 20120301Available from: 2012-02-14 Created: 2012-02-14 Last updated: 2012-03-01Bibliographically approved

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Schatz, Richard

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