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Morphology and atomic structure of the sputtered and annealed Mo3Si and Cr3Si (110) surfaces
KTH, Superseded Departments, Physics.
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1994 (English)In: Physical Review B, ISSN 01631829 (ISSN), Vol. 50, no 23, 17639-17642 p.Article in journal (Refereed) Published
Abstract [en]

Scanning tunneling microscopy was used to study the sputtered and annealed (110) surfaces of Mo3Si and Cr3Si. Both surfaces show extended and atomically flat terraces, but in the case of Mo3Si there is also a uniform distribution of Mo crystallites. This difference in morphology is discussed in terms of different preferential sputtering effects. In both cases, measured step heights show that the ideally bulk-truncated surfaces are either purely Si or metal terminated. Atomically resolved images suggest that the Mo3Si surface is Si terminated, but although no atomic resolution could be obtained for the Cr3Si surface, there are indications that this surface is instead metal terminated. © 1994 The American Physical Society.

Place, publisher, year, edition, pages
1994. Vol. 50, no 23, 17639-17642 p.
National Category
Condensed Matter Physics
URN: urn:nbn:se:kth:diva-83038DOI: 10.1103/PhysRevB.50.17639OAI: diva2:502748
Correspondence Address: Hammar, M.; Department of Physics, Royal Institute of Technology, S-100 44 Stockholm, Sweden NR 20140805Available from: 2012-02-14 Created: 2012-02-12 Last updated: 2012-02-14Bibliographically approved

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