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Extraction of a large set of laser parameters from different measurements
KTH, School of Information and Communication Technology (ICT), Microelectronics and Applied Physics, MAP. KTH, School of Information and Communication Technology (ICT), Microelectronics and Information Technology, IMIT. (Photonics)ORCID iD: 0000-0003-3056-4678
1996 (English)In: Semiconductor Laser Conference, 1996., 15th IEEE International, 1996, 175-176 p.Conference paper (Refereed)
Abstract [en]

We show how most of the parameters of a DFB laser can be extracted from a limited number of relatively simple measurements. These measurements include the ASE spectra at different currents below threshold, the RIN spectra above threshold and the P-I relation. We have performed curve-fitting on different characteristics such as the ASE spectrum, the RIN spectrum and the P-I curve. From the ASE spectrum measured in the vicinity of the lasing wavelength we can extract grating parameters, facet phases, refractive index and gain as well as the wavelength and current dependence of the last two parameters

Place, publisher, year, edition, pages
1996. 175-176 p.
Keyword [en]
ASE spectra;DFB laser parameter extraction;P-I relation;RIN spectra;RIN spectrum;below threshold;current dependence;facet phases;grating parameters;laser parameters;lasing wavelength;refractive index;relatively simple measurements;wavelength dependence;distributed feedback lasers;optical testing;refractive index measurement;semiconductor device testing;semiconductor lasers;superradiance;
National Category
Telecommunications Atom and Molecular Physics and Optics
URN: urn:nbn:se:kth:diva-89292DOI: 10.1109/ISLC.1996.558796OAI: diva2:503001
IEEE International Semiconductor Laser Conference
NR 20140805Available from: 2012-02-14 Created: 2012-02-14 Last updated: 2012-02-14Bibliographically approved

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