Residual stress evolution during decomposition of Ti(1-x)Al (x)N coatings using high-energy x-rays
2006 (English)In: RESIDUAL STRESSES VII / [ed] Reimers, W; Quander, S, 2006, Vol. 524-525, 619-624 p.Conference paper (Refereed)
Residual stresses and microstructural changes during phase separation in Ti33Al67N coatings were examined using microfocused high energy x-rays from a synchrotron source. The transmission geometry allowed simultaneous acquisition of x-ray diffraction data over 360 degrees and revealed that the decomposition at elevated temperatures occurred anisotropically, initiating preferentially along the film plane. The as-deposited compressive residual stress in the film plane first relaxed with annealing, before dramatically increasing concurrently with the initial stage of phase separation where metastable, nm-scale c-AlN platelets precipitated along the film direction. These findings were further supported from SAXS analyses.
Place, publisher, year, edition, pages
2006. Vol. 524-525, 619-624 p.
, MATERIALS SCIENCE FORUM, ISSN 0255-5476 ; 524-525
ceramic coatings, TiAlN, WAXS, SAXS, x-ray scattering, small-angle x-ray scattering, synchrotron radiation, x-ray diffraction
Metallurgy and Metallic Materials
IdentifiersURN: urn:nbn:se:kth:diva-86084ISI: 000241187200096OAI: oai:DiVA.org:kth-86084DiVA: diva2:503769
7th European Conference on Residual Stresses (ERCS 7). Berlin, GERMANY. SEP 13-15, 2006
QC 201202292012-02-162012-02-132014-05-23Bibliographically approved