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Electronic structure of UCx films prepared by sputter co-deposition
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2004 (English)In: Journal of Nuclear Materials, ISSN 0022-3115, E-ISSN 1873-4820, Vol. 334, no 1, 1-8 p.Article in journal (Refereed) Published
Abstract [en]

Thin layers of UCx (x = 0-12) have been prepared by sputter co-deposition of uranium and carbon in an Ar atmosphere. The films were investigated in-situ by ultraviolet and X-ray photoelectron spectroscopy (UPS and XPS, respectively). Special interest was put on the evolution of the electronic structure with the composition of the films, as deduced from the U-4f, C-1s and valence region spectra. With increasing carbon content, three types of carbon species were detected according to C-1s core level line, at 282, 282.6 and 284.5 eV binding energy (BE). They are attributed to the UC, UC2 and graphite phases, respectively. The U-4f core levels do not change strongly with increasing carbon content, showing well-itinerant U-5f electrons. Similarly, valence region spectra show three types of carbon species for different UCx films, which are differentiated by their C-2p signals. A strong hybridisation between C-2p and U-5f states is detected in UC, while the C-2p signal in UC2 appears only weakly hybridised, and for higher carbon contents a pi band characteristic of graphite appears.

Place, publisher, year, edition, pages
2004. Vol. 334, no 1, 1-8 p.
National Category
Atom and Molecular Physics and Optics
Identifiers
URN: urn:nbn:se:kth:diva-90345DOI: 10.1016/j.jnucmat.2004.03.007ISI: 000223548400001OAI: oai:DiVA.org:kth-90345DiVA: diva2:505033
Note
QC 20120305Available from: 2012-02-22 Created: 2012-02-22 Last updated: 2017-12-07Bibliographically approved

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Colarieti Tosti, Massimiliano
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