Model-based extraction of material properties in multifrequency atomic force microscopy
2012 (English)In: Physical Review B. Condensed Matter and Materials Physics, ISSN 1098-0121, E-ISSN 1550-235X, Vol. 85, no 19, 195449- p.Article in journal (Refereed) Published
We present a method to reconstruct the nonlinear tip-surface force and extract material properties from a multifrequency atomic force microscopy (AFM) measurement with a high-quality-factor cantilever resonance. In a measurement time of similar to 2 ms, we are able to accurately reconstruct the tip-surface force-displacement curve, allowing simultaneous high-resolution imaging of both topography and material properties at typical AFM scan rates. We verify the method using numerical simulations, apply it to experimental data, and use it to image mechanical properties of a polymer blend. We further discuss the limitations of the method and identify suitable operating conditions for AFM experiments.
Place, publisher, year, edition, pages
2012. Vol. 85, no 19, 195449- p.
IdentifiersURN: urn:nbn:se:kth:diva-98006DOI: 10.1103/PhysRevB.85.195449ISI: 000304395300007ScopusID: 2-s2.0-84861707952OAI: oai:DiVA.org:kth-98006DiVA: diva2:534637
FunderSwedish Research Council
QC 201206182012-06-182012-06-182015-02-09Bibliographically approved