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Improved multilayered structure with appropriate interface termination to enhance the imaging resolution in the infrared and optical canalization regime
KTH, School of Electrical Engineering (EES), Electromagnetic Engineering. KTH, School of Information and Communication Technology (ICT), Centres, Zhejiang-KTH Joint Research Center of Photonics, JORCEP.
KTH, School of Information and Communication Technology (ICT), Centres, Zhejiang-KTH Joint Research Center of Photonics, JORCEP.
2009 (English)In: 2008 Asia Optical Fiber Communication and Optoelectronic Exposition and Conference, AOE 2008, NEW YORK: IEEE , 2009Conference paper, Published paper (Refereed)
Abstract [en]

Improved structure and appropriate surface termination are utilized to enhance dramatically the subwavelength imaging resolution of a multilayered positive-negative permittivity structure with real material loss and operating in the infrared or optical canalization regime.

Place, publisher, year, edition, pages
NEW YORK: IEEE , 2009.
Keywords [en]
Imaging resolutions, Material loss, Multi-layered, Multi-layered structure, Negative permittivity, Subwavelength imaging, Surface termination
National Category
Atom and Molecular Physics and Optics
Identifiers
URN: urn:nbn:se:kth:diva-101654ISI: 000296471700190Scopus ID: 2-s2.0-74549114732ISBN: 978-1-55752-863-6 (print)OAI: oai:DiVA.org:kth-101654DiVA, id: diva2:548387
Conference
2008 Asia Optical Fiber Communication and Optoelectronic Exposition and Conference, AOE 2008; Shanghai; China; 30 October 2008 through 2 November 2008
Note

QC 20120830

Available from: 2012-08-30 Created: 2012-08-30 Last updated: 2017-06-13Bibliographically approved

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