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Spectroscopic defect imaging in magnetic nanostructure arrays
KTH, School of Industrial Engineering and Management (ITM), Materials Science and Engineering, Engineering Material Physics.ORCID iD: 0000-0003-4889-4210
2012 (English)In: Applied Physics Letters, ISSN 0003-6951, E-ISSN 1077-3118, Vol. 101, no 4, 042408- p.Article in journal (Refereed) Published
Abstract [en]

We introduce a method for imaging defective structures in an array of magnetic nanodevices using ferromagnetic resonance force microscopy with contrast between normal and defective devices provided through differences in resonance condition. In a demonstration of this technique, two dimensional scans of an array resolve not only intentional differences in resonant field between 200 nm circular dots and an intentional oval "defect," but also smaller differences between the nominally identical circular dots in the array.

Place, publisher, year, edition, pages
2012. Vol. 101, no 4, 042408- p.
Keyword [en]
Spin-Transfer-Torque, Ferromagnetic-Resonance, Tunnel-Junctions
National Category
Materials Engineering
Identifiers
URN: urn:nbn:se:kth:diva-102635DOI: 10.1063/1.4738789ISI: 000306944700058Scopus ID: 2-s2.0-84864492848OAI: oai:DiVA.org:kth-102635DiVA: diva2:555845
Note

QC 20120921

Available from: 2012-09-21 Created: 2012-09-21 Last updated: 2017-12-07Bibliographically approved

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Belova, Liubov M.

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