Rapid preparation of electron beam induced deposition Co magnetic force microscopy tips with 10 nm spatial resolution
2012 (English)In: Review of Scientific Instruments, ISSN 0034-6748, E-ISSN 1089-7623, Vol. 83, no 9, 093711- p.Article in journal (Refereed) Published
Magnetic force microscope Co spike tips with lateral magnetic resolution of 10 nm have been prepared. The Co spikes are grown by electron beam induced deposition of Co from Co-2(CO)(8) gas precursor. The high resolution Co spikes are fabricated at the spot of a tightly focused electron beam on the tip of commercial atomic force microscope cantilevers. Qualitative investigations indicate that a spike grown on a planar base of Co improves the signal to noise.
Place, publisher, year, edition, pages
2012. Vol. 83, no 9, 093711- p.
atomic force microscope cantilevers, electron beam-induced deposition, focused electron beams, gas precursors, high resolution, magnetic force microscopes, magnetic force microscopy tips, signal to noise, spatial resolution
Engineering and Technology
IdentifiersURN: urn:nbn:se:kth:diva-104712DOI: 10.1063/1.4752225ISI: 000309426700034ScopusID: 2-s2.0-84866980746OAI: oai:DiVA.org:kth-104712DiVA: diva2:567721
QC 201211142012-11-142012-11-092012-11-14Bibliographically approved