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Partial discharge analysis of a narrow dielectric gap with repetitive half-sine pulses
KTH, School of Electrical Engineering (EES), Electromagnetic Engineering.
KTH, School of Electrical Engineering (EES), Electromagnetic Engineering.
KTH, School of Electrical Engineering (EES), Electromagnetic Engineering.
2010 (English)In: Annual Report: Conference on Electrical Insulation and Dielectric Phenomena, 2010Conference paper, Published paper (Refereed)
Abstract [en]

Partial Discharge (PD) tests are carried out in a narrow dielectric gap between spherical electrodes at arbitrary voltage stimulus by a time-resolved measurement system. The usual AC voltage sinusoidal waveform application is compared with a new method based on repetitive half-sine voltage pulses, with either alternating or unipolar polarity. The half-sine pulse with duration T1 is followed by a pause period of zero voltage of duration T2 before the reversed polarity half-sine pulse. The effect of the pause period on the discharge activity is investigated. The results are shown for the case of 10 ms duration of the halfsine pulse, i.e. 50 Hz-like, but a pause between every two halfsine pulses can be varied. The PD signals are acquired with a Scope Corder that makes pulse sequential analysis possible. The differences between the two methods and the influence of a pause between two half-sine voltage periods to PD behavior is investigated.

Place, publisher, year, edition, pages
2010.
National Category
Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN: urn:nbn:se:kth:diva-105857DOI: 10.1109/CEIDP.2010.5724053Scopus ID: 2-s2.0-79952965107OAI: oai:DiVA.org:kth-105857DiVA: diva2:572582
Conference
2010 Annual Report Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2010;West Lafayette, IN;17 October 2010through20 October 2010
Note

QC 20130204

Available from: 2012-11-28 Created: 2012-11-28 Last updated: 2013-02-04Bibliographically approved
In thesis
1. Partial Discharge Analysis at Arbitrary Voltage Waveform Stimulus
Open this publication in new window or tab >>Partial Discharge Analysis at Arbitrary Voltage Waveform Stimulus
2012 (English)Licentiate thesis, comprehensive summary (Other academic)
Abstract [en]

Partial discharge (PD) detection is widely used to diagnose the defects and degradation in an electrical insulation system. Generally, PD are measured with 50 Hz AC sinusoidal voltage in the on-line situation, but can also be detected at other voltage stimulus in some off-line situations. In order to investigate the sequence or repetition rate of discharge pulses over time, Pulse Sequence Analysis (PSA) has een used by acquiring data from a time-resolved measurement system.

The aim of this work is to investigate other kinds of voltage waveform stimulus which can give a better understanding of the partial discharge behavior and a clearer picture of the physical environment around the defect. Therefore, some PD measurements have been performed by applying three types of arbitrary voltage stimulus. Firstly, the internal discharge was carried out in a narrow dielectric gap between spherical electrodes at half-sine pulse voltage of the alternating or unipolar polarity, and then the linearly ramped pulse voltage was applied. Corona discharge was achieved at the periodic negative step voltage in the needle-plane setup with the ground electrode covered with a layer of insulating material. The results show the effect of different voltage stresses on partial discharge characteristics, which could explain the discharge physical process.

A FEM-based numerical model was developed in order to study the in-depth physical process of corona discharge. The model focuses on the decay process of surface charges deposited on the insulation surface after the discharge events. It includes diffusion, bulk and surface conduction processes of surface charge decay. The simulation results have a good agreement with the measurement ones for corona discharge, which indicates the dominant mechanism of surface charge decay at different applied voltage levels.

Place, publisher, year, edition, pages
KTH Royal Institute of Technology, 2012
National Category
Other Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
urn:nbn:se:kth:diva-105837 (URN)978-91-7501-587-3 (ISBN)
Presentation
2012-12-18, H21, Teknikringen 33, KTH, Stockholm, 10:00 (English)
Opponent
Supervisors
Note

QC 20121128

Available from: 2012-11-28 Created: 2012-11-27 Last updated: 2016-11-24Bibliographically approved

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