Ronchi test for characterization of nanofocusing optics at a hard x-ray free-electron laser
2012 (English)In: Optics Letters, ISSN 0146-9592, E-ISSN 1539-4794, Vol. 37, no 24, 5046-5048 p.Article in journal (Refereed) Published
We demonstrate the use of the classical Ronchi test to characterize aberrations in focusing optics at a hard x-ray free-electron laser. A grating is placed close to the focus and the interference between the different orders after the grating is observed in the far field. Any aberrations in the beam or the optics will distort the interference fringes. The methodis simple to implement and can provide single-shot information about the focusing quality. We used the Ronchi test to measure the aberrations in a nanofocusing Fresnel zone plate at the Linac Coherent Light Source at 8.194 keV.
Place, publisher, year, edition, pages
2012. Vol. 37, no 24, 5046-5048 p.
Different order, Far field, Focusing optics, Fresnel zone plate, Hard X ray, Interference fringe, Linac Coherent Light Source, Nano-focusing, Ronchi test, Single-shot, Lasers, Light sources, Optics
Other Physics Topics
IdentifiersURN: urn:nbn:se:kth:diva-116618DOI: 10.1364/OL.37.005046ISI: 000312707600008ScopusID: 2-s2.0-84871311756OAI: oai:DiVA.org:kth-116618DiVA: diva2:600601
FunderSwedish Research Council
QC 201301252013-01-252013-01-222013-05-14Bibliographically approved