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Reflection phase characterization of the MEMS-based high impedance surface
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2012 (English)In: European Microwave Week 2012: "Space for Microwaves", EuMW 2012, Conference Proceedings - 42nd European Microwave Conference, EuMC 2012, 2012, 617-620 p.Conference paper, Published paper (Refereed)
Abstract [en]

The reflection properties of the MEMS-based HIS illuminated from oblique angles of incidence have been characterized numerically, and a quasi-optical measurement setup has been built for experimental characterization. The resonance frequency and the relative bandwidth are slightly increasing with the increase of the angle of incidence. The comparison between the simulated and measured results is discussed.

Place, publisher, year, edition, pages
2012. 617-620 p.
Keyword [en]
Electromagnetic reflection, High-impedance surfaces, Micro-electromechanical devices, Millimeter wave measurement
National Category
Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN: urn:nbn:se:kth:diva-117895Scopus ID: 2-s2.0-84874623611ISBN: 978-287487027-9 (print)OAI: oai:DiVA.org:kth-117895DiVA: diva2:603607
Conference
42nd European Microwave Conference, EuMC 2012 - Held as Part of 15th European Microwave Week, EuMW 2012; Amsterdam;29 October 2012 through 1 November 2012
Note

QC 20130325

Available from: 2013-02-06 Created: 2013-02-06 Last updated: 2013-03-25Bibliographically approved

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Sterner, MikaelOberhammer, Joachim
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Microsystem Technology (Changed name 20121201)
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