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2-Dimensional near-field millimeter-wave scanning with micromachined probe for skin cancer diagnosis
KTH, School of Electrical Engineering (EES), Micro and Nanosystems.
KTH, School of Electrical Engineering (EES), Micro and Nanosystems.
KTH, School of Electrical Engineering (EES), Micro and Nanosystems.
2013 (English)In: Micro Electro Mechanical Systems (MEMS), 2013 IEEE 26th International Conference on, New York: IEEE , 2013, 1057-1060 p.Conference paper, Published paper (Refereed)
Abstract [en]

This paper reports for the first time on the 2-dimensional scanning performance of a micromachined millimeter-wave (100 GHz) near-field probe with a substantially reduced tip size which is designed for skin cancer diagnosis. Furthermore, it introduces a novel concept of creating inhomogeneous test samples with tailor-made and locally altered permittivity which mimick skin tissue with small anomalies and are used for characterizing the probe. A probe prototype with a tip size of 300 x 600 mu m(2) and test samples with permittivity in the range of cancerous and healthy skin tissue were fabricated by micromachining and used for evaluating the sensitivity and resolution of the probe. This paper reports for the first time on 2-dimensional scanning performance, resolution, repeatability, long-term stability, and sensitivity, which are important for qualifying such measurement probes for medical applications. The resolution of the prototype, which is important for early detection of small tumor speckles, was found to be better than 200 mu m, i.e. 1/6 of the medium-normalized wavelength. The reproducibility of the probe setup including operator uncertainty is 1.36% (1 sigma) and the long term stability of reference measurements is 0.59% (1 sigma) over 8 hours.

Place, publisher, year, edition, pages
New York: IEEE , 2013. 1057-1060 p.
Series
Proceedings IEEE Micro Electro Mechanical Systems, ISSN 1084-6999
Keyword [en]
Basal-Cell Carcinoma, Spectroscopy
National Category
Electrical Engineering, Electronic Engineering, Information Engineering Medical Engineering
Identifiers
URN: urn:nbn:se:kth:diva-117898DOI: 10.1109/MEMSYS.2013.6474431ISI: 000320549200270Scopus ID: 2-s2.0-84875476982ISBN: 978-1-4673-5654-1 (print)OAI: oai:DiVA.org:kth-117898DiVA: diva2:603632
Conference
IEEE 26th International Conference on Micro Electro Mechanical Systems, MEMS 2013; Taipei; Taiwan; 20 January 2013 through 24 January 2013
Note

QC 20130815

Available from: 2013-02-06 Created: 2013-02-06 Last updated: 2013-08-15Bibliographically approved

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CiteExportLink to record
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