Full spatial characterization of a nanofocused x-ray free-electron laser beam by ptychographic imaging
2013 (English)In: Scientific Reports, ISSN 2045-2322, Vol. 3, 1633- p.Article in journal (Refereed) Published
The emergence of hard X-ray free electron lasers (XFELs) enables new insights into many fields of science. These new sources provide short, highly intense, and coherent X-ray pulses. In a variety of scientific applications these pulses need to be strongly focused. In this article, we demonstrate focusing of hard X-ray FEL pulses to 125 nmusing refractive x-ray optics. For a quantitative analysis of most experiments, the wave field or at least the intensity distribution illuminating the sample is needed. We report on the full characterization of a nanofocused XFEL beam by ptychographic imaging, giving access to the complex wave field in the nanofocus. From these data, we obtain the full caustic of the beam, identify the aberrations of the optic, and determine the wave field for individual pulses. This information is for example crucial for high-resolution imaging, creating matter in extreme conditions, and nonlinear x-ray optics.
Place, publisher, year, edition, pages
2013. Vol. 3, 1633- p.
Serial Femtosecond Crystallography, Parabolic Refractive Lenses, Diffraction Microscopy, Optics, Pulses
Engineering and Technology
IdentifiersURN: urn:nbn:se:kth:diva-122329DOI: 10.1038/srep01633ISI: 000317331200010OAI: oai:DiVA.org:kth-122329DiVA: diva2:622485
FunderSwedish Research Council
QC 201305222013-05-222013-05-202013-05-22Bibliographically approved