Change search
ReferencesLink to record
Permanent link

Direct link
Spin coated titanium-ruthenium oxide thin films
KTH, School of Chemical Science and Engineering (CHE), Chemical Engineering and Technology, Applied Electrochemistry.
KTH, School of Chemical Science and Engineering (CHE), Chemical Engineering and Technology, Applied Electrochemistry.ORCID iD: 0000-0001-5816-2924
Show others and affiliations
2013 (English)In: Thin Solid Films, ISSN 0040-6090, E-ISSN 1879-2731, Vol. 536, 74-80 p.Article in journal (Refereed) Published
Abstract [en]

Substrates of different roughness spin coated with Ti0.7Ru0.3O2 films have been evaluated as model system for fundamental studies of the industrially and scientifically interesting (Ti, Ru)O-2 based electrodes. The approach allowed for much more accurate control over the material synthesis than the traditionally used brush-, dip-, or spray-coating, on titanium-metal substrates. It moreover yielded well-defined samples suitable for basic studies of the surface properties that are of fundamental importance for understanding the electrochemical functionality of the electrode. We have compared the films on silicon substrates to films prepared by spin coating the same material on titanium-metal substrates. Samples have been characterized using atomic force microscopy (AFM), X-ray diffraction, scanning electronmicroscopy (SEM), and cyclic voltammetry. The samples displayed a uniformity of the films appropriate for AFM characterization. The smoother the substrate the less cracks in the coating. Using easily broken silicon wafers as substrate, a straightforward sample preparation technique was demonstrated for cross-section SEM. In addition, using high spinning velocities we have deposited the oxide films directly on silicon-nitride grids, thin enough to allow for studies with transmission electron microscopy without further sample preparation.

Place, publisher, year, edition, pages
2013. Vol. 536, 74-80 p.
Keyword [en]
Spin coating, Atomic force microscopy, Transmission electron microscopy, Cross-section scanning electron microscopy, Ruthenium dioxide-titanium dioxide, X-ray diffraction
National Category
Materials Engineering Physical Sciences
URN: urn:nbn:se:kth:diva-124287DOI: 10.1016/j.tsf.2013.03.044ISI: 000318974800010ScopusID: 2-s2.0-84877696954OAI: diva2:634900
Swedish Energy AgencySwedish Research Council

QC 20130702

Available from: 2013-07-02 Created: 2013-06-28 Last updated: 2013-07-02Bibliographically approved

Open Access in DiVA

No full text

Other links

Publisher's full textScopus

Search in DiVA

By author/editor
Gustavsson, JohnCornell, Ann
By organisation
Applied Electrochemistry
In the same journal
Thin Solid Films
Materials EngineeringPhysical Sciences

Search outside of DiVA

GoogleGoogle Scholar
The number of downloads is the sum of all downloads of full texts. It may include eg previous versions that are now no longer available

Altmetric score

Total: 66 hits
ReferencesLink to record
Permanent link

Direct link