Selected area visualization by FIB-milling for corrosion-microstructure analysis with submicron resolution
2013 (English)In: Materials letters (General ed.), ISSN 0167-577X, E-ISSN 1873-4979, Vol. 98, 230-233 p.Article in journal (Refereed) Published
We report the successful use of focussed ion beam (FIB) milling of trenches in a material of complex microstructure in order to visualize a selected area (32×32 μm) for further multi-analysis with submicron resolution. This capability is demonstrated for a Zn-5 wt% Al coating Galfan™ on steel. The very same eutectic surface area was analyzed by three complementary and independent techniques providing consistent information on the lateral distribution of morphology and elemental composition (scanning electron microscopy with x-ray microanalysis, SEM/EDS), topography and Volta potential (scanning Kelvin probe force microscopy, SKPFM) and oxide composition (confocal Raman microspectroscopy, CRM). The approach enables a straightforward way to explore the interplay between microstructure and local corrosion of metallic materials.
Place, publisher, year, edition, pages
2013. Vol. 98, 230-233 p.
Ion beam technology, Local corrosion, Local probing techniques, Metals and alloys, Microstructure, Complex microstructures, Confocal Raman microspectroscopy, Focussed ion beam millings, Ion beam technologies, Local probing, Scanning Kelvin probe force microscopy, Aluminum coatings, Corrosion, Ion beams, Milling (machining), Scanning electron microscopy, Surface topography
Other Chemistry Topics
IdentifiersURN: urn:nbn:se:kth:diva-134666DOI: 10.1016/j.matlet.2013.02.027ISI: 000320078300061ScopusID: 2-s2.0-84875137227OAI: oai:DiVA.org:kth-134666DiVA: diva2:677778
QC 201312102013-12-102013-11-272014-09-15Bibliographically approved