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Scanning coherent x-ray microscopy as a tool for XFEL nanobeam characterization
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2013 (English)In: Proceedings of SPIE: The International Society for Optical Engineering, 2013Conference paper (Refereed)
Abstract [en]

During the last years, scanning coherent x-ray microscopy, also called ptychography, has revolutionized nanobeam characterization at third generation x-ray sources. The method yields the complete information on the complex valued, nanofocused wave field with high spatial resolution. In an experiment carried out at the Matter in Extreme Conditions (MEC) instrument at the Linac Coherent Light Source (LCLS) we successfully applied the method to an attenuated nanofocused XFEL beam with a size of 180(h) × 150(v) nm2 (FWHM) in horizontal (h) and vertical direction (v), respectively. It was created by a set of 20 beryllium compound refractive lenses (Be-CRLs). By using a fast detector (CSPAD) to record the diffraction patterns and a fast implementation of the phase retrieval code running on a graphics processing unit (GPU), the applicability of the method as a real-time XFEL nanobeam diagnostic is highlighted.

Place, publisher, year, edition, pages
Keyword [en]
Coherent x-ray imaging, Compound refractive lenses, Ptychography, X-ray free electron laser, X-ray optics
National Category
Atom and Molecular Physics and Optics
URN: urn:nbn:se:kth:diva-137222DOI: 10.1117/12.2024784ISI: 000327084400020ScopusID: 2-s2.0-84888866822ISBN: 978-081949699-7OAI: diva2:678424
X-Ray Lasers and Coherent X-Ray Sources: Development and Applications X Conference; San Diego, CA, United States, 27-29 August 2013

QC 20140115

Available from: 2013-12-12 Created: 2013-12-12 Last updated: 2014-01-23Bibliographically approved

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Uhlén, FredrikVogt, Ulrich
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