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Diffractive optics for laboratory sources to free electron lasers
KTH, School of Engineering Sciences (SCI), Applied Physics, Biomedical and X-ray Physics.ORCID iD: 0000-0002-4394-0591
KTH, School of Engineering Sciences (SCI), Applied Physics, Biomedical and X-ray Physics.
KTH, School of Engineering Sciences (SCI), Applied Physics, Biomedical and X-ray Physics.
KTH, School of Engineering Sciences (SCI), Applied Physics, Biomedical and X-ray Physics.
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2013 (English)In: 11th International Conference On X-Ray Microscopy (XRM2012), Institute of Physics (IOP), 2013, Vol. 463, no 1, 012001- p.Conference paper, Published paper (Refereed)
Abstract [en]

In this contribution we present our recent results in the field of diffractive optics for both soft and hard x-ray radiation, and for laboratory sources to x-ray free electron lasers (XFEL). We developed a laboratory soft x-ray microscope that uses in-house produced zone plate optics as high-resolution objectives. We continuously try to improve these optics, both in terms of efficiency and resolution. Our latest development is the manufacturing of tungsten soft x-ray zone plates with outermost zone widths of 12 nm and 90 nm high structures. For hard x-rays, we investigated the possibility to use metal zone plates on a diamond substrate for nano-focusing of the European X-ray Free Electron Laser. The simulations show that the heat conduction is efficient enough to keep a zone plate well below melting temperature. However, metal zone plates will experience large and rapid temperature fluctuations of several hundred Kelvin that might prove fatal. To test this, we manufactured tungsten on diamond prototype zone plates and exposed them to radiation from the LCLS XFEL. Results show that metal zone plates can survive the XFEL beam.

Place, publisher, year, edition, pages
Institute of Physics (IOP), 2013. Vol. 463, no 1, 012001- p.
Series
Journal of Physics Conference Series, ISSN 1742-6588 ; 463
Keyword [en]
Zone Plates, Fabrication
National Category
Atom and Molecular Physics and Optics
Identifiers
URN: urn:nbn:se:kth:diva-137223DOI: 10.1088/1742-6596/463/1/012001ISI: 000327949000001Scopus ID: 2-s2.0-84891306833OAI: oai:DiVA.org:kth-137223DiVA: diva2:678425
Conference
11th International Conference on X-Ray Microscopy, XRM 2012; Shanghai; China; 5 August 2012 through 10 August 2012
Note

QC 20140113

Available from: 2013-12-12 Created: 2013-12-12 Last updated: 2014-01-13Bibliographically approved

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Vogt, UlrichHertz, Hans M.Holmberg, Anders

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Vogt, UlrichReinspach, JuliaUhlén, FredrikNilsson, DanielHertz, Hans M.Holmberg, Anders
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