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Electronic speckle pattern interferometry applied to shape and deformation measurement
KTH, Superseded Departments, Materials Processing.
2000 (English)Licentiate thesis, comprehensive summary (Other scientific)
Place, publisher, year, edition, pages
Institutionen för materialens processteknologi , 2000. , 39 p.
Trita-PM, 2000:2
URN: urn:nbn:se:kth:diva-1028OAI: diva2:6801
NR 20140805Available from: 2000-09-26 Created: 2000-09-26Bibliographically approved

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