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CHARACTERISATION OF X-RAY NANO-FOCUSING OPTICS WITH A GRATING INTERFEROMETER
KTH, School of Engineering Sciences (SCI), Applied Physics.
2014 (English)Independent thesis Advanced level (degree of Master (Two Years)), 20 credits / 30 HE creditsStudent thesis
Place, publisher, year, edition, pages
2014. , 34 p.
Series
TRITA-FYS, ISSN 0280-316X ; 2014:09
National Category
Physical Sciences
Identifiers
URN: urn:nbn:se:kth:diva-143030OAI: oai:DiVA.org:kth-143030DiVA: diva2:705145
Available from: 2014-03-14 Created: 2014-03-14 Last updated: 2014-03-14Bibliographically approved

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File name FULLTEXT01.pdfFile size 2447 kBChecksum SHA-512
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CiteExportLink to record
Permanent link

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Citation style
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
  • vancouver
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More styles
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  • de-DE
  • en-GB
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