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Optics and Instrumentation for Compact Soft X-Ray Microscopy
KTH, Superseded Departments, Physics.
2001 (Swedish)Licentiate thesis, comprehensive summary (Other scientific)
Abstract [sv]

This thesis describes thedevelopment of soft x-ray reflective optics and instrumentationfor compact soft x-ray microscopy. This microscope operates atthe wavelength 3.374 nm in the water-window (2.3 - 4.4 nm),where natural contrast between carbon and oxygen allows imagingof unstained biological material in their natural aqueousenvironment. A new design, with improvements in mechanical andthermal stability, results in an image quality approaching thatof synchrotron-based instruments.

Furthermore, the design andimplementation of a compact soft x-ray reflectometer based on alaser-plasma source is described. The reflectometer allowsrapid and accurate characterization of normal-incidencemultilayer coatings used at water-window wavelengths. Thisinstrument, which measures absolute reflectivity and multilayerperiod, is now used in the fabrication process, aiming toimprove the soft x-ray normal-incidence multilayer condensersystem of the compact soft x-ray microscope.

Place, publisher, year, edition, pages
Fysiska institutionen , 2001. , 52 p.
Keyword [en]
x-ray, multilayer, optics, microscopy
Identifiers
URN: urn:nbn:se:kth:diva-1327ISBN: 91-7283-187-1 (print)OAI: oai:DiVA.org:kth-1327DiVA: diva2:7153
Note
NR 20140805Available from: 2001-10-23 Created: 2001-10-23Bibliographically approved

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